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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Research of FBG sensor with low frequency characteristics
Gao, Xin-cun, Zhang, Yudong, Sasián, José, Han, Pei-qi, Liu, Tian-shan, Xiang, Libin, Han, Xi, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.865206
File:
PDF, 245 KB
english, 2010