SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Spectrum acquisition of detonation based on CMOS
Li, Yan, Jiang, Ya-Dong, Kippelen, Bernard, Bai, Yonglin, Wang, Bo, Yu, Junsheng, Liu, Baiyu, Xue, Yingdong, Zhang, Wei, Gou, Yongsheng, Bai, Xiaohong, Qin, Junjun, Xian, OuyangVolume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.865534
File:
PDF, 304 KB
english, 2010