![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Measuring of spectral BRDF using fiber optic spectrometer
Zhang, Wei, Jiang, Ya-Dong, Kippelen, Bernard, Wang, Fugang, Wang, Zhile, Yu, Junsheng, Wang, HongyuanVolume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.866129
File:
PDF, 337 KB
english, 2010