SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Study on the preparation of a high diffraction efficiency Dammann grating with subwavelength structure
Yang, Li, Leng, Yanbing, Dong, Lianhe, Namba, Yoshiharu, Walker, David D., Sun, Yanjun, Li, ShengyiVolume:
7655
Year:
2010
Language:
english
DOI:
10.1117/12.867091
File:
PDF, 300 KB
english, 2010