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SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, USA (Saturday 22 January 2011)] Solid State Lasers XX: Technology and Devices - Developing a more useful surface quality metric for laser optics
Turchette, Quentin, Clarkson, W. Andrew, Hodgson, Norman, Turner, Trey, Shori, RameshVolume:
7912
Year:
2011
Language:
english
DOI:
10.1117/12.873895
File:
PDF, 3.06 MB
english, 2011