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SPIE Proceedings [SPIE 1985 Los Angeles Technical Symposium - Los Angeles (Monday 21 January 1985)] Spectroscopic Characterization Techniques for Semiconductor Technology II - Photoreflectance Characterization Of GaAs/A1GaAs Thin Films, Heterojunctions And Multiple Quantum Well Structures
Glembocki, O. J., Shanabrook, B. V., Bottka, N., Beard, W. T., Comas, J., Pollak, Fred H., Tsu, RaphaelVolume:
524
Year:
1985
Language:
english
DOI:
10.1117/12.946323
File:
PDF, 476 KB
english, 1985