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SPIE Proceedings [SPIE 23rd Annual Technical Symposium - San Diego (Monday 27 August 1979)] Interferometry - Interferometric Testing In A Precision Optics Shop: A Review Of Testplate Testing
Karow, Hank H., Hopkins, George W.Volume:
192
Year:
1979
Language:
english
DOI:
10.1117/12.957837
File:
PDF, 333 KB
english, 1979