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SPIE Proceedings [SPIE 1980 Los Angeles Technical Symposium - Los Angeles (Monday 4 February 1980)] Optics in Adverse Environments II - On-line Infrared Process Signature Measurements Through Combustion Atmospheres
Zweibaum, Frederick M., Kozlowski, Alan T., Surette, Jr., William E., Kahan, Mark A.Volume:
216
Year:
1980
Language:
english
DOI:
10.1117/12.958467
File:
PDF, 19.53 MB
english, 1980