SPIE Proceedings [SPIE Soft X-Rays Optics and Technology - Berlin, Germany (Tuesday 8 December 1987)] Soft X-Ray Optics and Technology - Measurements Of Diffraction Properties Of Selected Multilayers Using A Triple-Axis Perfect Crystal X-Ray Diffractometer
Hornstrup, Allan, Christensen, Finn E., Schnopper, Herbert W., Koch, E., Schmahl, Guenther A.Volume:
733
Year:
1986
Language:
english
DOI:
10.1117/12.964929
File:
PDF, 418 KB
english, 1986