[IEEE 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Pisa, Italy (2015.5.11-2015.5.14)] 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings - Automated robust metric calibration of multi-focus plenoptic cameras
Heinze, Christian, Spyropoulos, Stefano, Hussmann, Stephan, Perwass, ChristianYear:
2015
Language:
english
DOI:
10.1109/i2mtc.2015.7151596
File:
PDF, 20.95 MB
english, 2015