Temperature Dependence of EPR Linewidth of Impurities in...

Temperature Dependence of EPR Linewidth of Impurities in Van-Vleck Paramagnets

L. K. Aminov, Yu. Yu. Kostetskii
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Volume:
158
Year:
1990
Language:
english
Pages:
8
DOI:
10.1002/pssb.2221580221
File:
PDF, 378 KB
english, 1990
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