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[IEEE 2015 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2015.12.7-2015.12.9)] 2015 IEEE International Electron Devices Meeting (IEDM) - Solving the paradox of the inconsistent size dependence of thermal stability at device and chip-level in perpendicular STT-MRAM
Thomas, Luc, Jan, Guenole, Le, Son, Lee, Yuan-Jen, Liu, Huanlong, Zhu, Jian, Serrano-Guisan, Santiago, Tong, Ru-Ying, Pi, Keyu, Shen, Dongna, He, Renren, Haq, Jesmin, Teng, Zhongjian, Annapragada, RaoYear:
2015
Language:
english
DOI:
10.1109/iedm.2015.7409773
File:
PDF, 997 KB
english, 2015