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[IEEE 2014 IEEE International Nanoelectronics Conference (INEC) - Sapporo, Japan (2014.7.28-2014.7.31)] 2014 IEEE International Nanoelectronics Conference (INEC) - Effects of array type of dummy active diffused region and gate geometries on narrow NMOSFETs with SiC S/D stressors
Lee, Chang-Chun, Hsieh, Chia-Ping, Liao, Ming-Han, Cheng, Sen-Wen, Guo, Yu-HuanYear:
2014
Language:
english
DOI:
10.1109/inec.2014.7460419
File:
PDF, 774 KB
english, 2014