![](/img/cover-not-exists.png)
[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - A novel integrated approach for simulation of electromagnetic susceptibility problem
Hong-Fang Jin,, Er-Ping Li,, En-Xiao Liu,Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513556
File:
PDF, 235 KB
english, 2005