Thermal Analysis of GaN-Based Light Emitting Diodes With Different Chip Sizes
Yang, Lianqiao, Hu, Jianzheng, Kim, Lan, Shin, Moo WhanYear:
2009
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2008.925348
File:
PDF, 816 KB
english, 2009