A Talbot-Lau X-Ray Deflectometer as a High-Energy Density Plasma Diagnostic
Valdivia, Maria Pia, Stutman, Dan, Stoeckl, Christian, Mileham, Chad S., Begishev, Ildar A., Bromage, Jake, Regan, Sean P.Year:
2016
Language:
english
Journal:
IEEE Transactions on Plasma Science
DOI:
10.1109/tps.2016.2552038
File:
PDF, 1.67 MB
english, 2016