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SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography - X-ray reflectivity of the AXAF VETA-I optics
Kellogg, Edwin M., Chartas, George, Graessle, Dale E., Hughes, John P., Van Speybroeck, Leon P., Zhao, Ping, Weisskopf, Martin C., Elsner, Ronald F., O'Dell, Stephen L., Hoover, Richard B., Walker II,Volume:
1742
Year:
1993
Language:
english
DOI:
10.1117/12.140552
File:
PDF, 695 KB
english, 1993