SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Imaging Spectrometry XVIII - sCMOS detector for imaging VNIR spectrometry
Eckardt, Andreas, Reulke, Ralf, Schwarzer, Horst, Venus, Holger, Neumann, Christian, Mouroulis, Pantazis, Pagano, Thomas S.Volume:
8870
Year:
2013
Language:
english
DOI:
10.1117/12.2021361
File:
PDF, 952 KB
english, 2013