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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - Spectrometer for single-shot x-ray emission and photon diagnostics
Hau-Riege, Stefan P., Moeller, Stefan P., Yabashi, Makina, Frassetto, F., Miotti, P., Callegari, C., de Simone, M., Finetti, P., Giangrisostomi, E., Grazioli, C., Iesari, F., Kivimäki, A., MincigrucciVolume:
9210
Year:
2014
Language:
english
DOI:
10.1117/12.2061765
File:
PDF, 1.20 MB
english, 2014