SPIE Proceedings [SPIE SPIE Scanning Microscopies - Monterey, California, United States (Tuesday 16 September 2014)] Scanning Microscopies 2014 - A novel approach for scanning electron microscopic observation in atmospheric pressure
Postek, Michael T., Newbury, Dale E., Platek, S. Frank, Maugel, Tim K., Ominami, Yusuke, Nakahira, Kenji, Kawanishi, Shinsuke, Ushiki, Tatsuo, Ito, SukehiroVolume:
9236
Year:
2014
Language:
english
DOI:
10.1117/12.2064935
File:
PDF, 23.63 MB
english, 2014