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SPIE Proceedings [SPIE Nondestructive Evaluation Techniques for Aging Infrastructure and Manufacturing - Scottsdale, AZ (Tuesday 3 December 1996)] Nondestructive Evaluation for Process Control in Manufacturing - Computer-enhanced photon tunneling microscopy for composite materials characterization and durability assessment
Kleinmeyer, James D., Bossi, Richard H., Moran, TomVolume:
2948
Year:
1996
Language:
english
DOI:
10.1117/12.259211
File:
PDF, 404 KB
english, 1996