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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII - Calibration of the UV/ion shields for the AXAF High-Resolution Camera
Meehan, G. R., Murray, Stephen S., Zombeck, Martin V., Kraft, Ralph P., Kobayashi, K., Chappell, John H., Kenter, Almus T., Barbera, Marco, Collura, Alfonso, Serio, Salvatore, Siegmund, Oswald H. W.,Volume:
3114
Year:
1997
Language:
english
DOI:
10.1117/12.283790
File:
PDF, 487 KB
english, 1997