SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray Microfocusing: Applications and Techniques - Progress toward submicron hard x-ray imaging using elliptically bent mirrors and its applications
MacDowell, Alastair A., Chang, Chang-Hasnain C., Lamble, G. M., Celestre, Richard S., Patel, J. R., Padmore, Howard A., McNulty, IanVolume:
3449
Year:
1998
Language:
english
DOI:
10.1117/12.330341
File:
PDF, 1.93 MB
english, 1998