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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Biomedical Photonics and Optoelectronic Imaging - X-ray source with microbeam
Wang, Kaige, Niu, Hanben, Liu, Hong, Luo, QingmingVolume:
4224
Year:
2000
Language:
english
DOI:
10.1117/12.403951
File:
PDF, 101 KB
english, 2000