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SPIE Proceedings [SPIE Europto Remote Sensing - Barcelona, Spain (Monday 25 September 2000)] SAR Image Analysis, Modeling, and Techniques III - Contour detection in high-resolution polarimetric SAR images
Borghys, Dirk C. J., Perneel, Christiaan, Acheroy, Marc P. J., Posa, Francesco, Guerriero, LucianoVolume:
4173
Year:
2000
Language:
english
DOI:
10.1117/12.410645
File:
PDF, 643 KB
english, 2000