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SPIE Proceedings [SPIE Smart Materials and MEMS - Melbourne, Australia (Wednesday 13 December 2000)] Smart Structures and Devices - Single-edge precracked beam test and electric fracture mechanics analysis for piezoelectric ceramics
Shindo, Yasuhide, Horiguchi, Katsumi, Murakami, Heihachiro, Narita, Fumio, Sood, Dinesh K., Lawes, Ronald A., Varadan, Vasundara V.Volume:
4235
Year:
2001
Language:
english
DOI:
10.1117/12.420894
File:
PDF, 266 KB
english, 2001