SPIE Proceedings [SPIE Lasers in Metrology and Art...

  • Main
  • SPIE Proceedings [SPIE Lasers in...

SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering - Tool 3D geometry measurement system

Zhao, Huijie, Ni, Jun, Sun, Yi, Lin, Xuewen, Hoefling, Roland, Jueptner, Werner P. O., Kujawinska, Malgorzata
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
4399
Year:
2001
Language:
english
DOI:
10.1117/12.445575
File:
PDF, 323 KB
english, 2001
Conversion to is in progress
Conversion to is failed