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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Surface Scattering and Diffraction for Advanced Metrology - Fabrication of one-dimensional random surfaces that display enhanced backscattering for only one specified angle of incidence
Ciftan, Mikael, Leskova, Tamara A., Maradudin, Alexei A., Gu, Zu-Han, Maradudin, Alexei A.Volume:
4447
Year:
2001
Language:
english
DOI:
10.1117/12.446732
File:
PDF, 175 KB
english, 2001