SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Charged Particle Detection, Diagnostics, and Imaging - Testing an electron beam deflection innovation
Retsky, Michael W., Delage, Olivier, Munro, Eric, Rouse, John A.Volume:
4510
Year:
2001
Language:
english
DOI:
10.1117/12.451282
File:
PDF, 803 KB
english, 2001