SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components - Far-infrared magneto-optic generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
Hofmann, Tino, Schubert, Mathias, Herzinger, Craig M., Duparr, Angela, Singh, BhanwarVolume:
4779
Year:
2002
Language:
english
DOI:
10.1117/12.453722
File:
PDF, 115 KB
english, 2002