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SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Optical Security and Counterfeit Deterrence Techniques IV - New flexible origination technology based on electron-beam lithography and its integration into security devices in combination with covert features based on DNA authentication
Drinkwater, John K., Ryzi, Zbynek, Outwater, Chris S., van Renesse, Rudolf L.Volume:
4677
Year:
2002
Language:
english
DOI:
10.1117/12.462712
File:
PDF, 854 KB
english, 2002