SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Optical 3D sensing and CAD/CAM for medicine and art conservation
Haeusler, Gerd, Benz, M., Ettl, Peter, Karbacher, Stefan, Laboureux, X., Lampalzer, R., Veit, K., Nkenke, E., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. HerbertVolume:
4900
Year:
2002
Language:
english
DOI:
10.1117/12.484492
File:
PDF, 1.18 MB
english, 2002