SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Residual stress measurement using a radial in-plane speckle interferometer and laser annealing: preliminary results
Viotti, Matias R., Suterio, Ricardo, Albertazzi, Jr., Armando, Kaufmann, Guillermo H., Osten, Wolfgang, Kujawinska, Malgorzata, Creath, KatherineVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.488195
File:
PDF, 402 KB
english, 2003