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SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise in Devices and Circuits - Phase noise metrology and modeling of microwave transistor applications to the design of state-of-the-art dielectric resonator oscillators
Llopis, Olivier, Cibiel, Gilles, Deen, M. Jamal, Celik-Butler, Zeynep, Levinshtein, Michael E.Volume:
5113
Year:
2003
Language:
english
DOI:
10.1117/12.497467
File:
PDF, 915 KB
english, 2003