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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Current Developments in Lens Design and Optical Engineering IV - Comparison of the measured and analytical response profiles of a 3.3- to 15.5-μ imaging system and the effect of detector diffusion
Bruce, Jr., Carl F., Mouroulis, Pantazis Z., Smith, Warren J., Johnson, R. BarryVolume:
5173
Year:
2003
Language:
english
DOI:
10.1117/12.511514
File:
PDF, 413 KB
english, 2003