SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Optical Fabrication, Testing, and Metrology - Alignment of two paraboloid off-axis sections by measuring the sagitta
Granados-Agustin, Fermin S., Percino-Zacarias, Maria E., Vazquez y Montiel, Sergio, Cornejo-Rodriguez, Alejandro, Geyl, Roland, Rimmer, David, Wang, LingliVolume:
5252
Year:
2004
DOI:
10.1117/12.513194
File:
PDF, 722 KB
2004