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SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V - Double resolution from a set of aliased images
Vandewalle, Patrick, Susstrunk, Sabine, Vetterli, Martin, Blouke, Morley M., Sampat, Nitin, Motta, Ricardo J.Volume:
5301
Year:
2004
Language:
english
DOI:
10.1117/12.526478
File:
PDF, 2.16 MB
english, 2004