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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2004 - San Jose, CA, United States (Monday 26 January 2004)] Light-Emitting Diodes: Research, Manufacturing, and Applications VIII - Reflectivity fitting for accurate thickness and compositional determination in RCLEDs
Sale, Terry E., Stockman, Steve A., Yao, H. Walter, Hild, Konstanze, Hosea, T. J., Schubert, E. Fred, Hirotani, Masumi, Kato, Y.Volume:
5366
Year:
2004
Language:
english
DOI:
10.1117/12.529654
File:
PDF, 283 KB
english, 2004