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SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Optical Design and Testing II - Annular subaperture interferometric testing technique for large aspheric surfaces
Hou, Xi, Wu, Fan, Wu, Shibin, Chen, Qiang, Wang, Yongtian, Weng, Zhicheng, Ye, Shenghua, Sasian, Jose M.Volume:
5638
Year:
2005
Language:
english
DOI:
10.1117/12.570188
File:
PDF, 144 KB
english, 2005