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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Optical Diagnostics - Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis
Nakano, Hiroki, Hanssen, Leonard M., Farrell, Patrick V., Mori, YumiVolume:
5880
Year:
2005
Language:
english
DOI:
10.1117/12.616232
File:
PDF, 216 KB
english, 2005