SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose, CA (Sunday 15 January 2006)] Image Processing: Algorithms and Systems, Neural Networks, and Machine Learning - 2D approaches to 3D watermarking: state-of-the-art and perspectives
Mitrea, M., Duţă, S., Prêteux, F., Dougherty, Edward R., Astola, Jaakko T., Egiazarian, Karen O., Nasrabadi, Nasser M., Rizvi, Syed A.Volume:
6064
Year:
2006
DOI:
10.1117/12.649831
File:
PDF, 578 KB
2006