SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 3 April 2006)] Optical Micro- and Nanometrology in Microsystems Technology - Three dimensional optics for three dimensional imaging: physics, fabrication, and computation
Arora, W. J., Gorecki, Christophe, Asundi, Anand K., Sun, W., Tian, K., Osten, Wolfgang, Stellman, P., Waller, L., Barbastathis, G.Volume:
6188
Year:
2006
Language:
english
DOI:
10.1117/12.665753
File:
PDF, 1.03 MB
english, 2006