SPIE Proceedings [SPIE SPIE Optics + Photonics - San Diego, California, USA (Sunday 13 August 2006)] Advanced Signal Processing Algorithms, Architectures, and Implementations XVI - Using mean-squared error to assess visual image quality
Beckner, Jr., Charles C., Luk, Franklin T., Matson, Charles L.Volume:
6313
Year:
2006
Language:
english
DOI:
10.1117/12.682154
File:
PDF, 276 KB
english, 2006