SPIE Proceedings [SPIE Electronic Imaging 2007 - San Jose, CA, USA (Sunday 28 January 2007)] Machine Vision Applications in Industrial Inspection XV - Imaging-based logics for ornamental stone quality chart definition
Bonifazi, Giuseppe, Meriaudeau, Fabrice, Niel, Kurt S., Gargiulo, Aldo, Serranti, Silvia, Raspi, CostantinoVolume:
6503
Year:
2007
Language:
english
DOI:
10.1117/12.694879
File:
PDF, 524 KB
english, 2007