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SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Comparison and uncertainties of standards for critical dimension atomic force microscope tip width calibration
Dixson, Ronald, Archie, Chas N., Orji, Ndubuisi G.Volume:
6518
Year:
2007
Language:
english
DOI:
10.1117/12.714032
File:
PDF, 131 KB
english, 2007