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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Profile detection by projection of coloured patterns
Fontani, Daniela, Francini, Franco, Sansoni, Paola, Jafrancesco, David, Mercatelli, Luca, Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L.Volume:
6616
Year:
2007
Language:
english
DOI:
10.1117/12.725090
File:
PDF, 572 KB
english, 2007