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SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Optical Design and Testing III - A subpixel localization method based on edge diffraction
Wang, Yongtian, Wang, Yuhua, Peng, Mingzi, Tschudi, Theo T., Rolland, Jannick P., Cheng, Xiang, Tatsuno, KimioVolume:
6834
Year:
2007
Language:
english
DOI:
10.1117/12.756158
File:
PDF, 222 KB
english, 2007