SPIE Proceedings [SPIE Ninth International Symposium on Laser Metrology - Unknown, Singapore (Monday 30 June 2008)] Ninth International Symposium on Laser Metrology - New simplified measuring method for distributed low-level birefringence
Gomi, Kenji, Quan, Chenggen, Asundi, Anand, Suzuki, Tomoyuki, Niitsu, Yasushi, Ichinose, KensukeVolume:
7155
Year:
2008
Language:
english
DOI:
10.1117/12.814536
File:
PDF, 679 KB
english, 2008