SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics...

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SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics - Prague, Czech Republic (Monday 20 April 2009)] EUV and X-Ray Optics: Synergy between Laboratory and Space - Enabling deposition of hard x-ray reflective coatings as an industrial manufacturing process

Garoli, Denis, Hudec, René, Pina, Ladislav, Boscolo Marchi, Enrico, Mattarello, Valentina, Bertoli, Juri, Salmaso, Guido, Kools, Jacques, Spiga, Daniele, Tagliaferri, Giampiero, Pareschi, Giovanni
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Volume:
7360
Year:
2009
Language:
english
DOI:
10.1117/12.820428
File:
PDF, 373 KB
english, 2009
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