SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, USA (Monday 13 April 2009)] Micro- and Nanotechnology Sensors, Systems, and Applications - High-throughput processes and structural characterization of single-nanotube based devices for 3D electronics
Kaul, A. B., George, Thomas, Islam, M. Saif, Megerian, K. G., Baron, R. L., Dutta, Achyut K., Jennings, A. T., Jang, D., Greer, J. R.Volume:
7318
Year:
2009
Language:
english
DOI:
10.1117/12.820723
File:
PDF, 1.94 MB
english, 2009